Designed to provide a highly stable, ergonomic and flexible probing platform for precise analytical probing applications up to 200 mm
Superior Mechanics: Highly stable granite base, Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges, 1 µm repeatable separation stroke
High Flexibility: Re-configurable for DC, RF, mmW, FA, WLR and more, Multiple accessories: Thermal chucks, motorized microscopes and positioners, dark box, and more
Ease of use: Low-profile, straightforward design
Double-side option: Front or backside probing capability