Ship high-yield KGD: Consistent low contact resistance and low-inductance probe tips ensure accurate and repeatable mmW RF measurements
Stable DUT operation: Power and ground planes at the DUT provide low-inductance power transmission paths. Patented bypass capacitors, physically close to DUT, ensure resonance-free DUT power supplies
Production robustness: Permanent probe tip placement improves test cell uptime reducing the cost of ownership compared to other probing technologies