Struggling to keep up with the nanochip deficiency? Microtron helps chip technology manufacturers test wafers quikcly, accurately and efficiently

The global shortage of microchips is affecting a large number of industries. As a manufacturer or supplier of chip technology, you want to eliminate any bottlenecks from production that are blocking the flow of chips to your customers. Long-term and inefficient tests are a thorn in the side of many manufacturers. Your wafer production is running at full speed, your customers are beating down your door, but you are losing a lot of time checking whether your chips are ready for market. With a fully automatic wafer probe station and accurate probe cards that test your wafers quickly and accurately 24/7, your production process will not be delayed.

WHY IS A FORMFACTOR PROBE STATION MORE EFFICIENT THAN MY CURRENT WAFER TESTING EQUIPMENT?

Do you currently use a manual or semi-automatic probe station to test your wafers?  Then your production is not only sensitive to human errors, you also lose time because your test procedures may stop completely in the evening, at night and on weekends.

FormFactor probe stations are fully automatic. This means that once the settings have been determined and the contact points for the sample cards have been set accurately, you can just let the machine do the work. All day, all night and also during the weekend. And also at a much higher speed and test capacity than with manual or semi-automatic testing stations.

REDUCTION OF MANPOWER AND TRAINING

With a manual test station, the reliability of your measurement results is largely dependent on the operator. The greater the testing capacity, the more experienced, highly trained operators you need. With a fully automatic probe station, you reduce the required number of operators as well as the complexity of human interactions.

Would you like to automate complex tasks such as Radio Frequency wafer probing? Then you can use the Contact Intelligence technology and Autonomous RF from FormFactor. After an operator has pre-programmed the probe station, Velox Pro – in combination with Wincal – takes over the calibration, measurement and monitoring.

The virtual assistant then continuously performs measurements and recalibrations until the entire wafer has been tested.

Would you like an update on the progress of your wafer probing, or would you like to change settings during the process? No problem. With Windows remote desktop or Teamviewer, you can connect to the Velox pro interface on your probe station from your (home) computer. You can set up, create and start measurement procedures from home. Ideal in a world that may also be increasingly oriented towards working from home in the future.

RELIABLE WAFER TESTING MEASUREMENTS

A fully automatic probe station reduces the need for human supervision and intervention. But then you also have to have confidence in the quality of your machines. After all, we can only call testing efficient and accurate when measurements can always be done with high precision. Your needles always land on the same pads with the same overtravel, with the same pressure and at the same location.

That is why FormFactor has developed probe cards that not only find the same contact pads for each measurement but also exert the same pressure on the wafer over and over again. This results in more accurate measurements that allow better prediction of the behaviour of the wafer in different circumstances.

FormFactor probe systems also take into account any deviations that may occur over multiple tests and measurements at different temperatures. On-the-fly recalibration is also done automatically, and probes are realigned if the deviation exceeds a predetermined limit.

Would you like more technical information about the capabilities of the FormFactor Probe stations and Probe cards?

WANT TO TALK WITH AN EXPERT ABOUT FORMFACTOR PROBE SYSTEMS?

ARE FORMFACTOR DEVICES SUITABLE FOR MY CHIP TECHNOLOGY?

Microchip applications are of course far from homogeneous. Probe systems can therefore be adapted to the required test objectives. Depending on the application, wafers can be tested repeatedly and with great accuracy for derating, resistance changes related to temperature changes, voltage changes and signal noise.

Probe stations can also be modified to meet the testing needs within certain sectors. For example, probes have been developed for the automotive sector that can measure accurate test results up to 300°.

HOW DO I CHOOSE THE RIGHT TEST EQUIPMENT FOR MY MICROCHIPS?

FormFactor offers a wide range of probe cards and probe stations for the most diverse applications. For the purpose of measuring radio frequencies alone, there are different versions per category of GHz and THz.

Each probe station can be adjusted based on the required test temperatures, the type of workstation (shielded or open), the need for vertical or horizontal testing, test capacity, etc. Not a simple choice, but it is critical to achieving efficient test procedures.

Microtron has been a partner of FormFactor for years. Our experts know the range through and through and have already matched dozens of companies with the right probe systems for their goals. They are happy to talk with you about probe stations, probe cards and accessories.

HOW DO I CHOOSE THE OPTIMAL PROBING SET-UP FOR MY WAFERS?

HOW DOES MICROTRON GO ABOUT ITS WORK?

After an initial discussion and analysis, we propose a set-up. We then deliver and install all the equipment, so you can get started immediately. Even after the placement, we are on standby should problems arise.

Have technical problems arisen? Does the system need to be readjusted to meet changing testing needs? We will send someone there to help you out of the crisis.

You can always contact Microtron for advice, delivery, installation, aftercare and training. Would you like to find out how to speed up the testing process of your microchips? Contact Microtron for a conversation and a customized solution for your market.